Aoxiang Tang, Niraj K. Jha. Thermal Characterization of Test Techniques for FinFET and 3D Integrated Circuits. JETC, 9(1):6, 2013. [doi]
@article{TangJ13,
title = {Thermal Characterization of Test Techniques for FinFET and 3D Integrated Circuits},
author = {Aoxiang Tang and Niraj K. Jha},
year = {2013},
doi = {10.1145/2422094.2422100},
url = {http://doi.acm.org/10.1145/2422094.2422100},
researchr = {https://researchr.org/publication/TangJ13},
cites = {0},
citedby = {0},
journal = {JETC},
volume = {9},
number = {1},
pages = {6},
}