New simulation methodology for effects of radiation in semiconductor chip structures

Henry H. K. Tang, Conal E. Murray, Giovanni Fiorenza, Kenneth P. Rodbell, Michael S. Gordon, David F. Heidel. New simulation methodology for effects of radiation in semiconductor chip structures. IBM Journal of Research and Development, 52(3):245-254, 2008. [doi]

Authors

Henry H. K. Tang

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Conal E. Murray

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Giovanni Fiorenza

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Kenneth P. Rodbell

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Michael S. Gordon

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David F. Heidel

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