A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines

Ching-Wen Tang, Wei-Lun Tsai, Chieh Lee, You-Lin Luo. A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines. IEEE Access, 13:69998-70005, 2025. [doi]

Authors

Ching-Wen Tang

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Wei-Lun Tsai

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Chieh Lee

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You-Lin Luo

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