A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines

Ching-Wen Tang, Wei-Lun Tsai, Chieh Lee, You-Lin Luo. A Novel VNA-Enhanced Technique for Ka-Band Insertion Loss Measurement in Microstrip Lines. IEEE Access, 13:69998-70005, 2025. [doi]

Abstract

Abstract is missing.