Xiaofeng Tang, Aiqiang Xu, Wenhai Li, Zhiyong Yang. Fault Models of CMOS Gates: An Empirical Study Based on Mutation Analysis. In IEEE 12th International Conference on Dependable, Autonomic and Secure Computing, DASC 2014, Dalian, China, August 24-27, 2014. pages 115-120, IEEE, 2014. [doi]
Abstract is missing.