Hongyu Tang, Huaiyu Ye, Cell K. Y. Wong, Stanely Y. Y. Leung, Jiajie Fan, Xianping Chen, Xuejun Fan, Guoqi Zhang. Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component. Microelectronics Reliability, 78:197-204, 2017. [doi]
Abstract is missing.