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SemiCon: A Semi-supervised Learning for Industrial Image Inspection

Weitao Tang, Tonglin Zhang, Baijian Yang 0001. SemiCon: A Semi-supervised Learning for Industrial Image Inspection. In 9th IEEE International Conference on Cyber Security and Cloud Computing, CSCloud 2022/8th IEEE International Conference on Edge Computing and Scalable Cloud, EdgeCom 2022, Xi'an, China, June 25-27, 2022. pages 12-17, IEEE, 2022. [doi]

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