Design-Model-Based Test Data Generation for Database Applications

Haruto Tanno, Xiaojing Zhang, Takashi Hoshino. Design-Model-Based Test Data Generation for Database Applications. In 23rd IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Dallas, TX, USA, November 27-30, 2012. pages 201-206, IEEE, 2012. [doi]

Authors

Haruto Tanno

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Xiaojing Zhang

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Takashi Hoshino

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