Haruto Tanno, Xiaojing Zhang, Takashi Hoshino. Design-Model-Based Test Data Generation for Database Applications. In 23rd IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Dallas, TX, USA, November 27-30, 2012. pages 201-206, IEEE, 2012. [doi]
@inproceedings{TannoZH12,
title = {Design-Model-Based Test Data Generation for Database Applications},
author = {Haruto Tanno and Xiaojing Zhang and Takashi Hoshino},
year = {2012},
doi = {10.1109/ISSREW.2012.32},
url = {http://dx.doi.org/10.1109/ISSREW.2012.32},
researchr = {https://researchr.org/publication/TannoZH12},
cites = {0},
citedby = {0},
pages = {201-206},
booktitle = {23rd IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Dallas, TX, USA, November 27-30, 2012},
publisher = {IEEE},
isbn = {978-1-4673-5048-8},
}