Parameterized test patterns methodology for layout design rule checking verification - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Mohamed Tantawy, Rafik Guindi, Mohamed Dessouky, Mohamed Al-Imam. Parameterized test patterns methodology for layout design rule checking verification. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015. pages 588-591, IEEE, 2015. [doi]

This author has not been identified. Look up 'Mohamed Tantawy' in GoogleThis author has not been identified. Look up 'Rafik Guindi' in GoogleThis author has not been identified. Look up 'Mohamed Dessouky' in GoogleThis author has not been identified. Look up 'Mohamed Al-Imam' in Google

runs on WebDSL