Mohamed Tantawy, Rafik Guindi, Mohamed Dessouky, Mohamed Al-Imam. Parameterized test patterns methodology for layout design rule checking verification. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015. pages 588-591, IEEE, 2015. [doi]
@inproceedings{TantawyGDA15,
title = {Parameterized test patterns methodology for layout design rule checking verification},
author = {Mohamed Tantawy and Rafik Guindi and Mohamed Dessouky and Mohamed Al-Imam},
year = {2015},
doi = {10.1109/ICECS.2015.7440385},
url = {http://dx.doi.org/10.1109/ICECS.2015.7440385},
researchr = {https://researchr.org/publication/TantawyGDA15},
cites = {0},
citedby = {0},
pages = {588-591},
booktitle = {2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015},
publisher = {IEEE},
isbn = {978-1-5090-0246-7},
}