Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction"

Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, Kenichi Matsumoto. Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction". IEEE Trans. Software Eng., 42(11):1092-1094, 2016. [doi]

Abstract

Abstract is missing.