Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey

Xian Tao, Xinyi Gong, Xin Zhang 0064, Shaohua Yan, Chandranath Adak. Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey. IEEE T. Instrumentation and Measurement, 71:1-21, 2022. [doi]

Abstract

Abstract is missing.