Value-Driven Mixed-Precision Quantization for Patch-Based Inference on Microcontrollers

Wei Tao, Shenglin He, Kai Lu, Xiaoyang Qu, Guokuan Li, Jiguang Wan, Jianzong Wang, Jing Xiao 0006. Value-Driven Mixed-Precision Quantization for Patch-Based Inference on Microcontrollers. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2024, Valencia, Spain, March 25-27, 2024. pages 1-6, IEEE, 2024. [doi]

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