Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes

Guoqiao Tao, Andrea Scarpa, Leo van Marwijk, Kitty van Dijk, Fred G. Kuper. Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. Microelectronics Reliability, 44(8):1269-1273, 2004. [doi]

Abstract

Abstract is missing.