Yang Tao, Hanyang Xu, Jorge R. Salas Avila, Christos Ktistis, Wuliang Yin, Anthony J. Peyton. Defect Feature Extraction in Eddy Current Testing Based on Convolutional Sparse Coding. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{TaoXAKYP19,
title = {Defect Feature Extraction in Eddy Current Testing Based on Convolutional Sparse Coding},
author = {Yang Tao and Hanyang Xu and Jorge R. Salas Avila and Christos Ktistis and Wuliang Yin and Anthony J. Peyton},
year = {2019},
doi = {10.1109/I2MTC.2019.8826935},
url = {https://doi.org/10.1109/I2MTC.2019.8826935},
researchr = {https://researchr.org/publication/TaoXAKYP19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019},
publisher = {IEEE},
isbn = {978-1-5386-3460-8},
}