Correlated Rare Failure Analysis via Asymptotic Probability Evaluation

Jun Tao 0001, Handi Yu, Yangfeng Su, Dian Zhou, Xuan Zeng 0001, Xin Li 0001. Correlated Rare Failure Analysis via Asymptotic Probability Evaluation. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(4):813-826, 2022. [doi]

Authors

Jun Tao 0001

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Handi Yu

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Yangfeng Su

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Dian Zhou

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Xuan Zeng 0001

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Xin Li 0001

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