Xian Tao, Dapeng Zhang, Wenzhi Ma, Zhanxin Hou, Zhenfeng Lu, Chandranath Adak. Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Network. IEEE Trans. Industrial Informatics, 18(11):7707-7717, 2022. [doi]
@article{TaoZMHLA22,
title = {Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Network},
author = {Xian Tao and Dapeng Zhang and Wenzhi Ma and Zhanxin Hou and Zhenfeng Lu and Chandranath Adak},
year = {2022},
doi = {10.1109/TII.2022.3142326},
url = {https://doi.org/10.1109/TII.2022.3142326},
researchr = {https://researchr.org/publication/TaoZMHLA22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {18},
number = {11},
pages = {7707-7717},
}