Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Network

Xian Tao, Dapeng Zhang, Wenzhi Ma, Zhanxin Hou, Zhenfeng Lu, Chandranath Adak. Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Network. IEEE Trans. Industrial Informatics, 18(11):7707-7717, 2022. [doi]

Abstract

Abstract is missing.