Characterization of New Static Independent-Gate-Biased FinFET Latches and Flip-Flops under Process Variations

Sherif A. Tawfik, Volkan Kursun. Characterization of New Static Independent-Gate-Biased FinFET Latches and Flip-Flops under Process Variations. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 311-316, IEEE Computer Society, 2008. [doi]

Abstract

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