Rajeshwary Tayade, Savithri Sundareswaran, Jacob A. Abraham. Small-Delay Defect Detection in the Presence of Process Variations. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 711-716, IEEE Computer Society, 2007. [doi]
Abstract is missing.