Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms

Anthony Taylor, Gregory A. Maston. Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 565-570, IEEE Computer Society, 1996.

@inproceedings{TaylorM96,
  title = {Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms},
  author = {Anthony Taylor and Gregory A. Maston},
  year = {1996},
  tags = {pattern language, testing},
  researchr = {https://researchr.org/publication/TaylorM96},
  cites = {0},
  citedby = {0},
  pages = {565-570},
  booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-3541-4},
}