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Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement

Karen Taylor, Bryan Nelson, Alan Chong, Henry C. Lin, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz. Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement. IEEE T. Instrumentation and Measurement, 54(3):975-987, 2005. [doi]

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Karen Taylor

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Bryan Nelson

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Alan Chong

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Henry C. Lin

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Eddie Chan

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Mani Soma

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Hosam Haggag

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Jeff Huard

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Jim Braatz

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