Karen Taylor, Bryan Nelson, Alan Chong, Henry C. Lin, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz. Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement. IEEE T. Instrumentation and Measurement, 54(3):975-987, 2005. [doi]
@article{TaylorNCLCSHHB05,
title = {Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement},
author = {Karen Taylor and Bryan Nelson and Alan Chong and Henry C. Lin and Eddie Chan and Mani Soma and Hosam Haggag and Jeff Huard and Jim Braatz},
year = {2005},
doi = {10.1109/TIM.2005.847348},
url = {http://dx.doi.org/10.1109/TIM.2005.847348},
tags = {architecture, testing, C++},
researchr = {https://researchr.org/publication/TaylorNCLCSHHB05},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {54},
number = {3},
pages = {975-987},
}