Satoshi Tayu, Shota Fukuyama, Shuichi Ueno. Universal Test Sets for Reversible Circuits. In My T. Thai, Sartaj Sahni, editors, Computing and Combinatorics, 16th Annual International Conference, COCOON 2010, Nha Trang, Vietnam, July 19-21, 2010. Proceedings. Volume 6196 of Lecture Notes in Computer Science, pages 348-357, Springer, 2010. [doi]
Abstract is missing.