Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Ramesh C. Tekumalla. On Test Set Generation for Efficient Path Delay Fault Diagnosis. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 343-348, IEEE Computer Society, 2000. [doi]
Abstract is missing.