Vasileios Tenentes, Xrysovalantis Kavousianos. Low Power Test-Compression for High Test-Quality and Low Test-Data Volume. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 46-53, IEEE Computer Society, 2011. [doi]
@inproceedings{TenentesK11,
title = {Low Power Test-Compression for High Test-Quality and Low Test-Data Volume},
author = {Vasileios Tenentes and Xrysovalantis Kavousianos},
year = {2011},
doi = {10.1109/ATS.2011.75},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.75},
researchr = {https://researchr.org/publication/TenentesK11},
cites = {0},
citedby = {0},
pages = {46-53},
booktitle = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011},
publisher = {IEEE Computer Society},
isbn = {978-1-4577-1984-4},
}