Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros. Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(10):1640-1644, 2010. [doi]
@article{TenentesKK10,
title = {Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores},
author = {Vasileios Tenentes and Xrysovalantis Kavousianos and Emmanouil Kalligeros},
year = {2010},
doi = {10.1109/TCAD.2010.2051096},
url = {http://dx.doi.org/10.1109/TCAD.2010.2051096},
tags = {testing},
researchr = {https://researchr.org/publication/TenentesKK10},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {29},
number = {10},
pages = {1640-1644},
}