Fei Teng, Longfei Zhou, Haoliang Liu, Qingyang Zhao, Zehang Li, Pengfei Liu, Yonggen Dai, Lu Gao, Zhichao Gou, Jiazheng Chen, Jiasheng Yang. A New Convolutional Neural Network for Identification of Damaged Electronic Components. In 6th International Conference on Universal Village, UV 2022, Boston, MA, USA, October 22-25, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.