Reliability of planar, Super-Junction and trench low voltage power MOSFETs

A. Testa, S. De Caro, S. Panarello, S. Patanè, Sebastiano Russo, D. Patti, S. Poma, Romeo Letor. Reliability of planar, Super-Junction and trench low voltage power MOSFETs. Microelectronics Reliability, 50(9-11):1789-1795, 2010. [doi]

Abstract

Abstract is missing.