Art Tevs, Martin Bokeloh, Michael Wand, Andreas Schilling, Hans-Peter Seidel. Isometric registration of ambiguous and partial data. In 2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2009), 20-25 June 2009, Miami, Florida, USA. pages 1185-1192, IEEE, 2009. [doi]
Abstract is missing.