K. Thangamuthu, M. Macari, S. Cohen. Automated Contactless Digital Test System for VLSI. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 634-639, IEEE Computer Society, 1982.
@inproceedings{ThangamuthuMC82,
title = {Automated Contactless Digital Test System for VLSI},
author = {K. Thangamuthu and M. Macari and S. Cohen},
year = {1982},
tags = {testing},
researchr = {https://researchr.org/publication/ThangamuthuMC82},
cites = {0},
citedby = {0},
pages = {634-639},
booktitle = {Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982},
publisher = {IEEE Computer Society},
}