WIP. Open-source standard cell characterization process flow on 45 nm (FreePDK45), 0.18 µm, 0.25 µm, 0.35 µm and 0.5 µm

Rabin Thapa, Samira Ataei, James E. Stine. WIP. Open-source standard cell characterization process flow on 45 nm (FreePDK45), 0.18 µm, 0.25 µm, 0.35 µm and 0.5 µm. In 2017 IEEE International Conference on Microelectronic Systems Education, MSE 2017, Lake Louise, AB, Canada, May 11-12, 2017. pages 5-6, IEEE, 2017. [doi]

Abstract

Abstract is missing.