Carl W. Thatcher. Design-For-Testability Economics. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 590, IEEE Computer Society, 1993.
@inproceedings{Thatcher93,
title = {Design-For-Testability Economics},
author = {Carl W. Thatcher},
year = {1993},
tags = {testing, design},
researchr = {https://researchr.org/publication/Thatcher93},
cites = {0},
citedby = {0},
pages = {590},
booktitle = {Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993},
publisher = {IEEE Computer Society},
isbn = {0-7803-1430-1},
}