Towards a Test Standard for Board and System Level Mixed-Signal Interconnects - researchr publication authors

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Carl W. Thatcher, Rodham E. Tulloss. Towards a Test Standard for Board and System Level Mixed-Signal Interconnects. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 300-308, IEEE Computer Society, 1993.

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