George Theodorou, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos. A Software-Based Self-Test methodology for on-line testing of processor caches. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-10, IEEE, 2011. [doi]
@inproceedings{TheodorouKPG11, title = {A Software-Based Self-Test methodology for on-line testing of processor caches}, author = {George Theodorou and Nektarios Kranitis and Antonis M. Paschalis and Dimitris Gizopoulos}, year = {2011}, doi = {10.1109/TEST.2011.6139154}, url = {http://dx.doi.org/10.1109/TEST.2011.6139154}, researchr = {https://researchr.org/publication/TheodorouKPG11}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011}, editor = {Bill Eklow and R. D. (Shawn) Blanton}, publisher = {IEEE}, isbn = {978-1-4577-0153-5}, }