Claude Thibeault. Using Fourier Analysis to Enhance IC Testability. In The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. pages 280-298, IEEE Computer Society, 1994.
@inproceedings{Thibeault94, title = {Using Fourier Analysis to Enhance IC Testability}, author = {Claude Thibeault}, year = {1994}, tags = {testing, analysis}, researchr = {https://researchr.org/publication/Thibeault94}, cites = {0}, citedby = {0}, pages = {280-298}, booktitle = {The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings}, publisher = {IEEE Computer Society}, isbn = {0-8186-6307-3}, }