Claude Thibeault, Luc Boisvert. On the Current Behavior of Faulty and Fault-Free ICs and the Impact on Diagnosis. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 202-210, IEEE Computer Society, 1998. [doi]
@inproceedings{ThibeaultB98,
title = {On the Current Behavior of Faulty and Fault-Free ICs and the Impact on Diagnosis},
author = {Claude Thibeault and Luc Boisvert},
year = {1998},
url = {http://computer.org/proceedings/dft/8832/88320202202abs.htm},
researchr = {https://researchr.org/publication/ThibeaultB98},
cites = {0},
citedby = {0},
pages = {202-210},
booktitle = {13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-8186-8832-7},
}