Claude Thibeault, Luc Boisvert. On the Current Behavior of Faulty and Fault-Free ICs and the Impact on Diagnosis. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 202-210, IEEE Computer Society, 1998. [doi]
Abstract is missing.