Claude Thibeault, A. Payeur. FFT-based test of a yield monitor circuit. In 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995. pages 243-251, IEEE Computer Society, 1995. [doi]
@inproceedings{ThibeaultP95,
title = {FFT-based test of a yield monitor circuit},
author = {Claude Thibeault and A. Payeur},
year = {1995},
doi = {10.1109/DFTVS.1995.476958},
url = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.1995.476958},
researchr = {https://researchr.org/publication/ThibeaultP95},
cites = {0},
citedby = {0},
pages = {243-251},
booktitle = {1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995},
publisher = {IEEE Computer Society},
isbn = {0-8186-7107-6},
}