A Fast Method to Evaluate the Optimum Number of Spares in Defect-Tolerant Integrated Circuits

Claude Thibeault, Yvon Savaria, Jean-Louis Houle. A Fast Method to Evaluate the Optimum Number of Spares in Defect-Tolerant Integrated Circuits. IEEE Transactions on Computers, 43(6):687-698, 1994.

Authors

Claude Thibeault

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Yvon Savaria

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Jean-Louis Houle

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