Matthias Thiele, Steve Bigalke, Jens Lienig. Electromigration Analysis of VLSI Circuits Using the Finite Element Method. In Michail Maniatakos, Ibrahim Abe M. Elfadel, Matteo Sonza Reorda, H. Fatih Ugurdag, José Monteiro, Ricardo Reis, editors, VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things - 25th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, Abu Dhabi, United Arab Emirates, October 23-25, 2017, Revised and Extended Selected Papers. Volume 500 of IFIP Advances in Information and Communication Technology, pages 133-152, Springer, 2017. [doi]
Abstract is missing.