Extensions of the witness method to characterize under-, over- and well-constrained geometric constraint systems - researchr publication

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Simon E. B. Thierry, Pascal Schreck, Dominique Michelucci, Christoph Fünfzig, Jean-David Génevaux. Extensions of the witness method to characterize under-, over- and well-constrained geometric constraint systems. Computer-Aided Design, 43(10):1234-1249, 2011. [doi]

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