Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications

Steven Thijs, Mototsugu Okushima, Jonathan Borremans, Philippe Jansen, Dimitri Linten, Mirko Scholz, Piet Wambacq, Guido Groeseneken. Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 49-52, IEEE, 2008. [doi]

@inproceedings{ThijsOBJLSWG08,
  title = {Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications},
  author = {Steven Thijs and Mototsugu Okushima and Jonathan Borremans and Philippe Jansen and Dimitri Linten and Mirko Scholz and Piet Wambacq and Guido Groeseneken},
  year = {2008},
  doi = {10.1109/CICC.2008.4672017},
  url = {http://dx.doi.org/10.1109/CICC.2008.4672017},
  researchr = {https://researchr.org/publication/ThijsOBJLSWG08},
  cites = {0},
  citedby = {0},
  pages = {49-52},
  booktitle = {Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008},
  publisher = {IEEE},
  isbn = {978-1-4244-2018-6},
}