Controllable Defect Engineering in 2D-MoS2 for high-performance, threshold switching memristive devices

Asmita S. Thool, Sourodeep Roy, Abhishek Misra, Bhaswar Chakrabarti. Controllable Defect Engineering in 2D-MoS2 for high-performance, threshold switching memristive devices. In Device Research Conference, DRC 2022, Columbus, OH, USA, June 26-29, 2022. pages 1-2, IEEE, 2022. [doi]

@inproceedings{ThoolRMC22,
  title = {Controllable Defect Engineering in 2D-MoS2 for high-performance, threshold switching memristive devices},
  author = {Asmita S. Thool and Sourodeep Roy and Abhishek Misra and Bhaswar Chakrabarti},
  year = {2022},
  doi = {10.1109/DRC55272.2022.9855777},
  url = {https://doi.org/10.1109/DRC55272.2022.9855777},
  researchr = {https://researchr.org/publication/ThoolRMC22},
  cites = {0},
  citedby = {0},
  pages = {1-2},
  booktitle = {Device Research Conference, DRC 2022, Columbus, OH, USA, June 26-29, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-9883-8},
}