Implementing Boundary-Scan and Pseudo-Random BIST in an Asynchronous Transfer Mode Switch - researchr publication authors

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P. Thorel, J. L. Rainard, A. Botta, A. Chemarin, J. Majos. Implementing Boundary-Scan and Pseudo-Random BIST in an Asynchronous Transfer Mode Switch. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 131-139, IEEE Computer Society, 1991.

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