Claire Thorp, Sean Sisti, Walter D. Bennette. Feature Extraction for Out of Distribution Detection via Self-Supervised Learning. In M. Arif Wani, Mehmed M. Kantardzic, Vasile Palade, Daniel Neagu, Longzhi Yang, Kit Yan Chan, editors, 21st IEEE International Conference on Machine Learning and Applications, ICMLA 2022, Nassau, Bahamas, December 12-14, 2022. pages 920-924, IEEE, 2022. [doi]
Abstract is missing.