Thomas Thüm, Christoph Seidl, Ina Schaefer. On language levels for feature modeling notations. In Carlos Cetina, Oscar Díaz, Laurence Duchien, Marianne Huchard, Rick Rabiser, Camille Salinesi, Christoph Seidl, Xhevahire Tërnava, Leopoldo Teixeira, Thomas Thüm, Tewfik Ziadi, editors, Proceedings of the 23rd International Systems and Software Product Line Conference, SPLC 2019, Volume B, Paris, France, September 9-13, 2019. ACM, 2019. [doi]
@inproceedings{ThumSS19,
title = {On language levels for feature modeling notations},
author = {Thomas Thüm and Christoph Seidl and Ina Schaefer},
year = {2019},
doi = {10.1145/3307630.3342404},
url = {https://doi.org/10.1145/3307630.3342404},
researchr = {https://researchr.org/publication/ThumSS19},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the 23rd International Systems and Software Product Line Conference, SPLC 2019, Volume B, Paris, France, September 9-13, 2019},
editor = {Carlos Cetina and Oscar Díaz and Laurence Duchien and Marianne Huchard and Rick Rabiser and Camille Salinesi and Christoph Seidl and Xhevahire Tërnava and Leopoldo Teixeira and Thomas Thüm and Tewfik Ziadi},
publisher = {ACM},
isbn = {978-1-4503-6668-7},
}