Thomas Thüm, Christoph Seidl, Ina Schaefer. On language levels for feature modeling notations. In Carlos Cetina, Oscar Díaz, Laurence Duchien, Marianne Huchard, Rick Rabiser, Camille Salinesi, Christoph Seidl, Xhevahire Tërnava, Leopoldo Teixeira, Thomas Thüm, Tewfik Ziadi, editors, Proceedings of the 23rd International Systems and Software Product Line Conference, SPLC 2019, Volume B, Paris, France, September 9-13, 2019. ACM, 2019. [doi]
Abstract is missing.