The Challenge of Testing VLSI in the 1980 s

William P. Thurston. The Challenge of Testing VLSI in the 1980 s. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 3, IEEE Computer Society, 1981.

Authors

William P. Thurston

This author has not been identified. Look up 'William P. Thurston' in Google